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Fujiwara, Yukio; Hanada, Masaya; Okumura, Yoshikazu; Watanabe, Kazuhiro; Kawai, Kenichi*
Review of Scientific Instruments, 71(8), p.3059 - 3064, 2000/08
Times Cited Count：10 Percentile：55.17(Instruments & Instrumentation)no abstracts in English
Fujiwara, Yukio; Hanada, Masaya; Kawai, Kenichi*; *; Miyamoto, Kenji; Okumura, Yoshikazu; Watanabe, Kazuhiro
JAERI-Research 99-013, 32 Pages, 1999/02
JAERI-Research-99-013.pdf:1.51MB
no abstracts in English
Watanabe, Kazuhiro; Fujiwara, Yukio; Hanada, Masaya; Inoue, Takashi; Miyamoto, Kenji; Miyamoto, Naoki*; Ohara, Yoshihiro; Okumura, Yoshikazu
Review of Scientific Instruments, 69(2), p.986 - 988, 1998/02
Times Cited Count：2 Percentile：29.69(Instruments & Instrumentation)no abstracts in English
ionsWatanabe, Kazuhiro; Fujiwara, Yukio; Hanada, Masaya; Inoue, Takashi; Miyamoto, Kenji; Miyamoto, Naoki*; Ohara, Yoshihiro; Okumura, Yoshikazu
Proc. of Joint Meeting of 8th Int. Symp. on the Production and Neutralization of Negative Ions & Beams, p.179 - 186, 1997/00
no abstracts in English
Okumura, Yoshikazu
Kino Zairyo, 0(7), p.42 - 53, 1989/07
no abstracts in English
ion source with multi-aperture extractorOkumura, Yoshikazu; Horiike, Hiroshi; Inoue, Takashi; Kurashima, Toru; Matsuda, Shinzaburo; Ohara, Yoshihiro; Tanaka, Shigeru
4th Int.Symp.on Production and Neutralization of Negative Ions and Beams, p.309 - 318, 1987/00
no abstracts in English
